A Study on the Transfer of GISSMO Material Card Parameters from 2D- to 3D-Discretization

This study presents basic strategies for transfer of LS-DYNA® material card parameters from 2D- to 3D-discretizaion without extensive recalibration. The responses of a material card, calibrated on two-dimensional shell elements, are shown on single-element tests with different element formulations, on multi-element patches and on coupons. From this, magnitudes of error are ascertained and quick recalibration measures on material model parameters are derived. An evaluation of the stress-state of typical GISSMO-type specimen in different thicknesses and discretization-lengths is given and typical stress-states within the Lode-triaxiality stress-space of these specimens are highlighted. Therefrom, a measure of deviation from the calibrated state can be derived and used as a measure for allowable deviation from the 2D stress-state. Furthermore, the information on the three-dimensional stress-states, even in thin specimen, can be used for quick recalibration of parameters on the failure surface.